Showing results 9 to 12 of 12
Measurement of the steady-state minority carrier diffusion length in a HgCdTe photodiode Jung, H; Lee, Hee Chul; Kim, CK, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.35, no.10B, pp.1321 - 1323, 1996-10 |
Photocurrent effect on the zero-bias dynamic resistance of HgCdTe photodiode Kim, K; Jung, H; Shin, H; Lee, Hee Chul; Kim, CK, JOURNAL OF ELECTRONIC MATERIALS, v.26, no.6, pp.662 - 666, 1997-06 |
Rapid thermal diffusion of indium in p-HgCdTe/CdTe Park, SM; Kim, JM; Lee, Hee Chul; Kim, Choong Ki, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.35, no.12A, pp.1554 - 1557, 1996-12 |
Surface leakage current analysis of ion implanted ZnS-passivated n-on-p HgCdTe diodes in weak inversion Kim, YH; Bae, SH; Lee, Hee Chul; Kim, CK, JOURNAL OF ELECTRONIC MATERIALS, v.29, no.6, pp.832 - 836, 2000-06 |
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