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Safe Motion Planning Against Multimodal Distributions Based on a Scenario Approach Ahn, Heejin; Chen, Colin; Mitchell, Ian M.; Kamgarpour, Maryam, IEEE CONTROL SYSTEMS LETTERS, v.6, pp.1142 - 1147, 2022 |
Synthesis of Lithography Test Patterns Using Machine Learning Model Kareem, Pervaiz; Shin, Youngsoo, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.34, no.1, pp.49 - 57, 2021-02 |
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