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Retention failure analysis of metal-oxide based resistive memory Choi, Shinhyun; Lee, Jihang; Kim, Sungho; Lu, Wei D., APPLIED PHYSICS LETTERS, v.105, no.11, 2014-09 |
Tuning Resistive Switching Characteristics of Tantalum Oxide Memristors through Si Doping Kim, Sungho; Choi, ShinHyun; Lee, Jihang; Lu, Wei D., ACS NANO, v.8, no.10, pp.10262 - 10269, 2014-10 |
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