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A NEW TECHNIQUE FOR CHARACTERIZATION OF THE END RESISTANCE IN MODULATION-DOPED FETS Lee, Kwyro; SHUR, MS; VALOIS, AJ; ROBINSON, GY; ZHU, XC; VANDERZIEL, A, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.31, no.10, pp.1394 - 1398, 1984 |
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