Browse "EE-Journal Papers(저널논문)" by Title 

Showing results 9381 to 9400 of 14200

9381
Overcoming Half-Duplex Loss in Multi-Relay Networks: Multiple Relay Coded Cooperation for Optimal DMT

Hong, Bi; Choi, Wan, IEEE TRANSACTIONS ON COMMUNICATIONS, v.63, no.1, pp.66 - 78, 2015-01

9382
Overcoming interference in spatial multiplexing MIMO cellular networks

Andrews, Jeffrey G.; Choi, Wan; Heath, Robert W., Jr., IEEE WIRELESS COMMUNICATIONS, v.14, no.6, pp.95 - 104, 2007-12

9383
Overcoming the "retention vs. voltage'' trade-off in nonvolatile organic memory: Ag nanoparticles covered with dipolar self-assembled monolayers as robust charge storage nodes

Lee, Seungwon; Lee, Jinhwan; Lee, Hyunsoo; Yuk, Young Ji; Kim, Mincheol; Moon, Hanul; Seo, Jaewon; et al, ORGANIC ELECTRONICS, v.14, no.12, pp.3260 - 3266, 2013-12

9384
Overcoming the electroluminescence efficiency limitations of perovskite light-emitting diodes

Cho, Himchan; Jeong, Su-Hun; Park, Min-Ho; Kim, Young-Hoon; Wolf, Christoph; Lee, Chang-Lyoul; Heo, Jin Hyuck; et al, SCIENCE, v.350, no.6265, pp.1222 - 1225, 2015-12

9385
Overcomplete blind source separation of finite alphabet sources

Ihm, Bin-Chul; Park, Dong-Jo; Kwon, Young-Hyun, IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, v.E84D, no.1, pp.209 - 212, 2001-01

9386
Overcurrent protection control technique for a ZCS series resonant rectifier

Jung, YS; Ko, JS; Moon, GunWoo; Youn, Myung Joong, INTERNATIONAL JOURNAL OF ELECTRONICS, v.80, no.2, pp.355 - 363, 1996-02

9387
Overestimation of Oxide Defects Density in Large Test Capacitors Due to Plasma Processing

Shin, Hyung-Cheol; Je, Minkyu; Hu, Chenming, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.44, no.9, pp.1554 - 1556, 1997-09

9388
Oversampling 형태를 갖는 Discrete Gabor Representation을 이용한 고품질 표적 ISAR 영상의 효율적인 획득

박지훈; 양우용; 배준우; 강성철; 명로훈, 한국전자파학회 논문지, v.24, no.5, pp.566 - 573, 2013-05

9389
OWARU: free space-aware timing-driven incremental placement with critical path smoothing

Jung, Jinwook; Nam, Gijoon; Reddy, Lakshmi; Jiang, Iris Huiru; Shin, Youngsoo, IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, v.37, no.9, pp.1825 - 1838, 2018-09

9390
Oxidation and sublimation suppression of PbTe thermoelectric legs by plasma coated ceramic layers

Park, Sang Hyun; Kim, Yeongseon; Yoo, Chung-Yul; Yoon, Gi-Wan, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, v.34, no.6, 2016-11

9391
Oxide electronics: Translating materials science from lab-to-fab

Nathan, Arokia; Jeon, Sanghun, MRS BULLETIN, v.46, no.11, pp.1028 - 1036, 2021-11

9392
Oxide Heterostructure Resistive Memory

Yang, Yuchao; Choi, ShinHyun; Lu, Wei, NANO LETTERS, v.13, no.6, pp.2908 - 2915, 2013-06

9393
Oxygen Atmosphere Annealing Effect on the Thermal Stability of TiO2-x Based Films for Shutter-Less Infrared Image Sensors

Reddy, Y. Ashok Kumar; Kang, In-Ku; Shin, Young Bong; Lee, Hee Chul, Key Engineering Materials, v.775, pp.272 - 277, 2018-08

9394
Oxygen Defect-Induced Metastability in Oxide Semiconductors Probed by Gate Pulse Spectroscopy

Lee, Sungsik; Nathan, Arokia; Jeon, Sanghun; Robertson, John, SCIENTIFIC REPORTS, v.5, 2015-10

9395
Oxygen partial pressure and thermal annealing dependent properties of RF magnetron sputtered TiO2-x films

Reddy, Y. Ashok Kumar; Kang, In-ku; Shin, Young Bong; Lee, Hee-Chul; Reddy, P. Sreedhara, MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, v.32, pp.107 - 116, 2015-04

9396
Oxygen Scavenging in HfZrOx-Based n/p-FeFETs for Switching Voltage Scaling and Endurance/Retention Improvement

Kim, Bong Ho; Kuk, Song-Hyeon; Kim, Seong Kwang; Kim, Joon Pyo; Suh, Yoon-Je; Jeong, Jaeyong; Geum, Dae-Myeong; et al, ADVANCED ELECTRONIC MATERIALS, v.9, no.5, 2023-05

9397
Oxygen scavenging of HfZrO2-based capacitors for improving ferroelectric properties

Kim, Bong Ho; Kuk, Song-hyeon; Kim, Seong Kwang; Kim, Joon Pyo; Geum, Dae-Myeong; Baek, Seung-Hyub; Kim, Sang Hyeon, NANOSCALE ADVANCES, v.4, no.19, pp.4114 - 4121, 2022-09

9398
Oxygen vacancy control as a strategy to achieve highly reliable hafnia ferroelectrics using oxide electrode

Goh, Youngin; Cho, Sung Hyun; Park, Sang-Hee Ko; Jeon, Sanghun, NANOSCALE, v.12, no.16, pp.9024 - 9031, 2020-04

9399
Oxygen Vacancy Control as a Strategy to Enhance Imprinting Effect in Hafnia Ferroelectric Devices

Jeong, Yeongseok; Gaddam, Venkateswarlu; Goh, Youngin; Shin, Hunbeom; Lee, Sangho; Kim, Giuk; Jeon, Sanghun, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.70, no.1, pp.354 - 359, 2023-01

9400
P-Channel Nonvolatile Flash Memory With a Dopant-Segregated Schottky-Barrier Source/Drain

Choi, Sung-Jin; Han, Jin-Woo; Moon, Dong-Il; Kim, Sung-Ho; Jang, Moon-Gyu; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.57, no.8, pp.1737 - 1742, 2010-08

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