Showing results 2 to 4 of 4
Influence of thermal annealing on the structural and optical properties of polycrystalline Cd0.96Zn0.04Te thin films Sridharan, MG; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, v.7, pp.1483 - 1491, 2005-06 |
Optical constants of vacuum-evaporated Cd0.96Zn0.04Te thin films measured by spectroscopic ellipsometry Sridharan, M; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, v.13, no.8, pp.471 - 476, 2002-08 |
Spectroscopic ellipsometry studies on polycrystalline Cd0.9Zn0.1Te thin films Sridharan, MG; Mekaladevi, M; Rodriguez-Viejo, J; Narayandass, SK; Mangalaraj, D; Lee, Hee Chul, PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, v.201, pp.782 - 790, 2004-03 |
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