Showing results 1 to 2 of 2
Enhanced bolometric properties of TiO2-x thin films by thermal annealing Reddy, Y. Ashok Kumar; Shin, Young Bong; Kang, In-Ku; Lee, Hee Chul; Reddy, P. Sreedhara, APPLIED PHYSICS LETTERS, v.107, no.2, 2015-07 |
Oxygen partial pressure and thermal annealing dependent properties of RF magnetron sputtered TiO2-x films Reddy, Y. Ashok Kumar; Kang, In-ku; Shin, Young Bong; Lee, Hee-Chul; Reddy, P. Sreedhara, MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, v.32, pp.107 - 116, 2015-04 |
Discover