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Results 1-10 of 428 (Search time: 0.005 seconds).

NO Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date)
Unit Cell Modeling of Interconnect Isolated by Metal-filled Via Array for High Crosstalk Immunity

Kim, Jounghoresearcher; Lee, Heeseok; Park, Bongcheol; Kam, Dong Gun, IEEE 6th Workshop on Signal Propagation on Interconnects, pp.41 - 43, IEEE, 2002

Measurement of Picosecond Pulse Propagation Characteristics on Coplanar Transmission Lines

Kim, Jounghoresearcher; Lee, Jongjoo; Yu, S., 5th IEEE Workshop on Signal Propagation on Interconnects, IEEE, 2001

Microwave Frequency Dielectric Constant and Loss Tangent Measurements of PCB materials Using Stripline Structure

Kim, Jounghoresearcher; Kim, Jingook; Lee, Junho; Kim, Namhoon; Lee, Junwoo, APACK2001, 2001

In-situ Retrieval and Display of Femtosecond Optical Pulses and Picosecond Electrical Pulses

Kim, Jounghoresearcher; Kim, Woopoung; Lee, Heeseok, Ultrafast Phenomena Conference, pp.72 - 73, 1998-07

Picosecond Pulse Propagation Measurement on CPW Using A Photoconductive Near-Field Probe

Kim, Jounghoresearcher; Lee, Jongjoo, 2th MINT Milimeter-wave International, pp.109 - 112, 2001

RF Interconnect for Multi-Gbit/sec Board-Level Clock Distribution

Kim, Jounghoresearcher; Ryu, Woonghwan; Kim, Hyungsoo; Ahn, Seungyoung; Kim, Namhoon; Choi, Baekkyu, 8th Topical Meeting on Electrical Performance of Electronic Packaging, 1999-10

Radiated emission from Plasma Display Panel (PDP) depending on addressing line structure and current driving scheme

Jeong, Y.; Lee, J.; Kim, J.; Choi, S.; Kim, Jounghoresearcher; Park, H.H.; Kang, K.; Kim, H.; Whang, K., 2002 IEEE International Symposium on Electromagnetic Compatibility, v.1, pp.140 - 143, IEEE, 2002-08-19

Picosecond-pulse propagation measurement on microstrip meander lines using a novel optical near-field mapping probe

Lee, J.; Kim, Jounghoresearcher, IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging, pp.117 - 120, IEEE, 2001-10-29

Microwave frequency crosstalk model of redistribution line patterns of wafer level package

Sung, M.; Kim, N.; Lee, J.; Choi, B.; Park, I.; Hong, J.-K.; Kwon, Y.; Choi, K.S.; Kim, Jounghoresearcher, IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging, pp.109 - 112, IEEE, 2001-10-29

Suppression of radiated emission from an 8-bit micro-controller using gate-oxide filtering capacitors

Kim, Hyungsoo; Kim, Jonghoon; Ryu, Woonghwan; Sung, Myunghee; Ahn, Seungyoung; Kim, Jounghoresearcher, Proceedings of the 1999 IEEE EMC Symposium on 'Electromagnetic Compatibility', v.2, pp.811 - 815, IEEE, 1999-08-02

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