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| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Sub-5nm All-Around Gate FinFET for Ultimate Scaling Lee, Hyunjin; Yu, Lee-Eun; Ryu, Seong-Wan; Han, Jin-Woo; Jeon, Kanghoon; Jang, Dong-Yoon; Kim, Kuk-Hwan; Lee, Jiye; Kim, Ju-Hyun; Jeon, Sang Cheol; Lee, Gi Seong; Oh, Jae Sub; Park, Yun Chang; Bae, Woo Ho; Lee, Hee Mok; Yang, Jun Mo; Yoo, Jung Jae; Kim, Sang Ik; Choi, Yang-Kyu, IEEE Symposium on VLSI Technology Digest of Technical Papaers, pp. 70-71, 2006-06-13 |
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