Results 11-12 of 12 (Search time: 0.004 seconds).
NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
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Wireless Memory Test: A Breakthrough Solution for Highly Reliable HBM Park, Hyunwook; Kim, Joungho; Kim, Subin; Kim, SeongGuk; Jeong, Seung Taek; Park, Gap Yeol, Designcon 2021, IEEE, 2021-08-17 | |
Neural Language Model Enables Extremely Fast and Robust Routing on Interposer Kim, Minsu; Kim, Joungho; Park, Hyunwook; Choi, Seonguk; Kim, Haeyeon; Kim, SeongGuk; Son, Keeyoung; Kim, Keunwoo; Lho, Daehwan, Designcon 2021, IEEE, 2021-08-17 |
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