Browse "EE-Conference Papers(학술회의논문)" by Author Xu, Z
Showing results 1 to 3 of 3
| A study of quasi-breakdown mechanism in ultra thin gate oxide under various types of stress Cho, Byung Jin; Guan, H; Xu, Z; Li, MF; He, YD, Materials Research Society (MRS) 1999 Fall Meeting Symp., pp.0 - 0, 1999-11-29 |
| A study of quasi-breakdown mechanism in ultra-thin gate oxide by using DCIV technique Cho, Byung Jin; Guan, H; Li, MF; He, YD; Xu, Z; Dong, Z, the 7th International Symp. on the Physical and Failure Analysis of Integrated Circuits, pp.81 - 81, 1999-07-05 |
| Bipolar current stressing and electrical recovery of quasi-breakdown in thin gate oxides Cho, Byung Jin; Loh, WY; Li, MF; Xu, Z, 8th International Symp. on the Physical and Failure Analysis of Integrated Circuits (IPFA), pp.59 - 59, 2001-07-09 |
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Type
- 107 Article
- 8 Book
- 22,776 Conference
Date issued
- 2,090 2020 - 2024
- 8,145 2010 - 2019
- 7,999 2000 - 2009
- 3,741 1990 - 1999
- 870 1980 - 1989