Browse "EE-Conference Papers(학술회의논문)" by Author Tan, DPP

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1
Effects of Cu diffusion on MOSFET electrical properties

Cho, Byung Jin; Zhu, C; Yoo, WJ; Tan, DPP; Lim, SY, 18th International VLSI Multilevel Interconnection Conf. (VMIC), pp.0 - 0, 2001-11-28

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