Showing results 1 to 8 of 8
AIM-Spice, a New Circuit Simulator Based on a Unified Charge Control Mode Ytterdal, T.; Lee, Kwyro; Shur, M.; Fjeldly, T.A, 1st Int. Device Reseach Symposium, Charlottesville, VA, pp.481 - 484, ISDRS, 1991 |
Computer Aided Design for Si and GaAs Integrated Circuit Lee, Kwyro; Shur, M.; Fjeldly , T. A.; Ytterdal, T., Korea-US IC Design Automation and Manufacturing Workshop, pp.71 - 80, 1993 |
Continuous Heterostructure Field Effect Transistor Model Moon, B. J.; Byun, Y. H.; Lee, Kwyro; Shur, M., Proc. Int. Sym. Circuits and Systems, pp.3069 - 3072, IEEE, 1990 |
New Analytical Poly-Si Thin-Film Transistor Model Lee, Kwyro; Byun, Y.H.; Shur, M.; Hack, M., Proc. of 1st Int. Device Reseach Symposium, pp.537 - 540, 1991-12 |
pi-Heterojunction Field Effect Transistor Lee, Kwyro; Shur, M., Proc. of SPIE Symposium on Advances in Semiconductors and Superconductors, pp.269 - 269, 1990 |
Speed and Convergence Properties of Improved MOSFET Models Included in the Circuit Simulator AIM-Spice Lee, Kwyro; Ytterdal, T.; Fjeldly, T.A.; Shur, M., Proc. of 2nd Int. Device Reseach Symposium, pp.345 - 348, 1993 |
Unified CMOS Model for Circuit Simulation Fjeldly, T. A.; Shur, M.; Ytterdal, M. S.; Lee, Kwyro, Proc. of 1st Int. Device Reseach Symposium, v.35, no.12, pp.407 - 410, Elsevier, 1992 |
Unified I-V Model and Parameter Extraction of Submicron nMOSFET for Circuit Simulaton and Statistical Process Characterization Lee, Kwyro; Park, C.K.; Moon, B.J.; Shur, M., VLSI Process/Device Modeling Workshop, pp.144 - 145, 1990 |
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