Browse "EE-Conference Papers(학술회의논문)" by Author Shin S.Y.
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| Coded exposure imaging for projective motion deblurring Tai, Yu-Wing; Kong N.; Lin S.; Shin S.Y., 2010 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR 2010, pp.2408 - 2415, IEEE, 2010-06-13 |
| Optical Modular Architectures for Multi-Layer BAM with 2-Dimensional Patterns Lee, Soo-Young; Lee, H.J.; Shin S.Y., Optical Computing, 1991-03 |
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