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The effects of Ge composition and Si cap thickness on hot carrier reliability of Si/Sil-xGex/Si p-MOSFETs with high-K/metal gate

Loh, W.-Y.; Majhi, P.; Lee, S.-H.; Oh, J.-W.; Sassman, B.; Young, C.; Bersuker, G.; et al, 2008 Symposium on VLSI Technology Digest of Technical Papers, VLSIT, pp.56 - 57, 2008-06-17

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