Browse "EE-Conference Papers(학술회의논문)" by Author Roh, Young Tak
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| TID and SEE hardened n-MOSFET layout on a bulk silicon substrate which combines a DGA n-MOSFET and a guard drain Roh, Young Tak; Lee, Hee Chul, 2015 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2015, Institute of Electrical and Electronics Engineers Inc., 2015-11-02 |
| Total Ionization Dose Effect (TID) and Single Event Effect (SEE) Hardened n-MOSFET Layout Lee, Hee Chul; Roh, Young Tak, International SoC Design Conference (ISOCC), ISOCC, 2017-11-06 |
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