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Showing results 1 to 5 of 5

1
A Comprehensive Study of Hot-Carrier Effects in Body-Tied FinFETs

Choi, Yang-Kyu; Han, Jin-Woo; Lee, Choong-Ho; Park, Donggun, 2005 International Conference on Solid State Devices and Materials Proceedings, pp.876 - 877, 2005-09

2
Body Effects in Tri-Gate Bulk FinFETs for DTMOS

Choi, Yang-Kyu; Han, Jin-Woo; Lee, Choong-Ho; Park, Donggun, IEEE Nanotechnology Materials and Devices Conference, 123, 2006-10

3
Demonstration of Ge pMOSFETs with 6 Å EOT using TaN/ZrO2/Zr-cap/n-Ge(100) gate stack fabricated by novel vacuum annealing and in-situ metal capping method

Shin, Yunsang; Chung, Wonil; Seo, Yujin; Lee, Choong-Ho; Sohn, Dong Kyun; Cho, Byung Jin, 2014 Symposium on VLSI Technology, VLSI Symposium, 2014-06-11

4
Extraction Method of Source and Drain to Gate Overlap Length in Thin-Body FinFETs

Choi, Yang-Kyu; Han, Jin-Woo; Lee, Choong-Ho; Park, Donggun, The 14th Korean Conference on Semiconductors (KCS), pp.619 - 620, 2007-02

5
Guideline for Worst Hot Carrier Stress Condition Using Substrate Current in a Body-Tied FinFET

Choi, Yang-Kyu; Han, Jin-Woo; Lee, Hyunjin; Lee, Choong-Ho; Park, Donggun, The 12th Korean Conference on Semiconductors (KCS), pp.99 - 100, 2005-02

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