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Showing results 1 to 10 of 10

1
A compact GaAs MESFET-based push-push oscillator MMIC using differential topology with low phase-noise performance

Yoon, S.-W.; Lee, C.-H.; Kim, M.-G.; Kim, C.-H.; Lee, J.; Laskar, J.; Hong, Songcheol, 23rd Annual GaAs IC Symposium 2001, pp.45 - 48, IEEE, 2001-10-21

2
Dynamic negative bias temperature instability and comprehensive modeling in PMOS body-tied FinFETs

Lee, H.; Lee, C.-H.; Park, D.; Choi, Yang-Kyu, 44th Annual IEEE International Reliability Physics Symposium, IRPS 2006, pp.725 - 726, IEEE, 2006-03-26

3
Evolutionary multi-objective optimization for generating artificial creature's personality

Lee, C.-H.; Lee, K.-H.; Kim, Jong-Hwan, IEEE Congress on Evolutionary Computation, CEC 2007, pp.2450 - 2455, IEEE, 2007-09-25

4
Evolving personality of a genetic robot in ubiquitous environment

Kim, Jong-Hwan; Lee, C.-H.; Lee, K.-H.; Kuppuswamy, N.S., 16th IEEE International Conference on Robot and Human Interactive Communication, RO-MAN 2007, pp.848 - 853, IEEE, 2007-08-26

5
Hybrid parallel evolutionary algorithms for constrained optimization utilizing PC clustering

Lee, C.-H.; Park, K.-H.; Kim, Jong-Hwan, Congress on Evolutionary Computation 2001, pp.1436 - 1441, IEEE, 2001-05-27

6
Multiobjective evolutionary algorithm reinforcing specific objective

Lee, C.-H.; Kim, Y.-H.; Kim, Jong-Hwan, 2008 IEEE Congress on Evolutionary Computation, CEC 2008, pp.2889 - 2893, IEEE, 2008-06-01

7
Negative bias temperature instability in SOI and body-tied double-gate FinFETs

Lee, H.; Lee, C.-H.; Park, D.; Choi, Yang-Kyu, 2005 Symposium on VLSI Technology, pp.110 - 111, IEEE, 2005-06-14

8
Novel frequency and power monitoring method for WDM network

Shin, S.K.; Lee, C.-H.; Chung, Yun Chur, Proceedings of the 1998 Optical Fiber Communication Conference, OFC'98, pp.168 - 170, 1998-02-22

9
Parallel quantum-inspired genetic algorithm for combinatorial optimization problem

Han, K.-H.; Park, K.-H.; Lee, C.-H.; Kim, Jong-Hwan, Congress on Evolutionary Computation 2001, pp.1422 - 1429, IEEE, 2001-05-27

10
The influence of gate poly-silicon oxidation on negative bias temperature instability in 3D FinFET

Lee, H.; Lee, C.-H.; Park, D.; Choi, Yang-Kyu, 45th Annual IEEE International Reliability Physics Symposium 2007, IRPS, pp.680 - 681, IEEE, 2007-04-15

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