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Capacitance Boosting by Anti-Ferroelectric Blocking Layer in Charge Trap Flash Memory Device

Shin, Eui-Joong; Shin, Sung-Won; Lee, Seung-Hwan; Lee, Tae-In; Kim, Min-Ju; Ahn, Hyun-Jun; Kim, Jae-Hwan; et al, 66th Annual IEEE International Electron Devices Meeting, IEDM 2020, IEEE, 2020-12-14

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