Browse "EE-Conference Papers(학술회의논문)" by Author Hummon, Matthew T.
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| Chip-scale wavelength standards(*) Bopp, Douglas G.; Hummon, Matthew T.; Kang, Songbai; Kitching, John; Li, Qing; Westly, Daron A.; Kim, Sangsik; et al, 7th International School of Physics "Enrico Fermi" on New Frontiers for Metrology: From Biology and Chemistry to Quantum and Data Science, pp.443 - 449, IOS Press BV, 2019-07 |
| Photonically integrated spectroscopy platform using grating-to-grating coupling (Conference Presentation) Bopp, Doug; Kang, Songbai; Hummon, Matthew T.; Kitching, John E.; Aksyuk, Vladimir A.; Srinivasan, Kartik A.; Kim, Sangsik; et al, Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI, SPIE, 2018-03-14 |
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