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Browse "EE-Conference Papers(학술회의논문)" by Author Huang, J.

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1
Mechanisms limiting EOT scaling and gate leakage currents of high-k/metal gate stacks directly on SiGe and a method to enable sub-1nm EOT

Huang, J.; Kirsch, P.D.; Oh, J.; Lee, S.H.; Price, J.; Majhi, P.; Harris, H.R.; et al, 2008 Symposium on VLSI Technology Digest of Technical Papers, VLSIT, pp.82 - 83, 2008-06-17

2
Platelet sensing of microenvironmental geometry guides adhesion and spreading

Kita, A.; Rounsevell, R.; Seok, T.J.; Yu, Kyoungsik; Huang, J.; Wu, M.; Fletcher, D.; et al, BMES (Biomedical Engineering Society Annual Meeting) 2011, v.21, no.2, BMES, 2011-10-15

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