Showing results 1 to 1 of 1
Comprehensive Understanding of the HZO-based n/pFeFET Operation and Device Performance Enhancement Strategy Kuk, Song-Hyeon; Han, Seung-Min; Kim, Bong-Ho; Baek, Seung-Hyub; Han, Jae-Hoon; Kim, Sang-Hyeon, 2021 IEEE International Electron Devices Meeting, IEDM 2021, pp.33.6.1 - 33.6.4, Institute of Electrical and Electronics Engineers Inc., 2021-12 |
Discover