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Multi-scale Approach for Roughness Effect of Si-SiO2 Nanowire Interface on Electronic Transport

Kim, Byung-Hyun; Kim, Seungchul; Jung, Hyo Eun; Chung, YongChae; Shin, Min-Cheol; Lee, Kwang-Ryeol, The 9th International Conference on Computational Physcics, ICCP-9, 2015-01-09

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