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Defect probability of directed self-assembly lithography: fast identification and post-placement optimization Shim, Seongbo; Chung, Woo Hyun; Shin, Youngsoo, 2015 International Conference On Computer Aided Design, pp.404 - 409, ACM SIGDA and IEEE CEDA, 2015-11-03 |
Redundant via insertion in directed self-assembly lithography Shim, Seong Bo; Chung, Woo Hyun; Shin, Young Soo, Design, Automation & Test in Europe (DATE), pp.55 - 60, European Design and Automation Association (EDAA), 2016-03-15 |
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