Browse "EE-Conference Papers(학술회의논문)" by Author Chung, Moo-Kyeong

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Current Status and Challenges of SoC Verification for Embedded Systems Market

Kyung, Chong-Min; Yang, Wooseung; Chung, Moo-Kyeong, IEEE International SOC Conference, pp.213 - 216, 2003-09

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