Showing results 1 to 19 of 19
A 1GHz 1.3dB NF +13dBm Output P1dB SOI CMOS Low Noise Amplifier for SAW-less Receivers Kim, B.-K.; Im, D; Choi, J; Lee, Kwyro, 2012 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2012, IEEE, 2012-06 |
A Heuristic Approach for Simulation of time-course Visual Adaptation for High Dynamic Image Streams Ro, YongMan; Kelvin, B; Yang, S; Choi, J; Park, SJ, 한국정보처리학회 2007년 춘계발표학술대회, 2007-05-01 |
A signal detector for weak composite signals in additive and signal-dependent noise Kim, S; Choi, J; Kim, Hyung-Myung; Kim, SY; Park, SI; Song, Iickho, The 14th Sympoisum on Information Theory and Its Applications, pp.747 - 750, 1991-12 |
Code Design for Type-I Wiretap Channel Thanks Hyun, M; Song, W; Choi, J; Yoo, S; Ha, Jeongseok, IEEE 39th Annual Allerton Conference on Communication, Control and Computing, pp.1424 - 1429, IEEE, 2011-09 |
Code-division multiplexing based MIMO channel sounder with loosely synchronous codes and kasami codes Choi, J; Chung, H; Lee, H; Cha, J; Lee, HyuckJae, 2006 IEEE 64th Vehicular Technology Conference, VTC-2006 Fall, pp.109 - 113, IEEE, 2006-09-25 |
Formation of Yb silicides for n-channel Schottky barrier source/drain Na, S; Choi, J; Seo, Y; Kim, H; Lee, Seok-Hee; Lee, HJ, 2010 한국재료학회 추계학술대회, 한국재료학회, 2010-11-11 |
FPN Reduction in a Self-adaptive CMOS Image Sensor Using a Hard-reset Mode Choi, J; Lee, J; Baek, I; Yang, Kyounghoon, Korean Conference on Semiconductors, Korean Conference on Semiconductors, 2011 |
Hardware-Efficient Non-decimation RF Sampling Receiver Front-End with Reconfigurable FIR Filtering Choi, J; Im, D; Kim, B.-K.; Lee, Kwyro, 2012 38th European Solid-State Circuits Conference, ESSCIRC, pp.125 - 128, IEEE, 2012-09 |
Iterative Distributed Amplitude Optimization for Distributed Detection in Wireless Sensor Networks Ha, Jeongseok; Choi, J, IEEE VTC (Vehicular Technology Conference), pp.1 - 5, IEEE, 2012-05 |
MMSE-based distributed beamforming in cooperative relay networks Choi, J; Ha, Jeongseok, IEEE MWSCAS 2011, IEEE, 2011-08 |
MOSFET Device Originated Harmonic Distortion Analysis and Optimum Design Methodology for SOI SPDT RF Switch Im, D; Kim, B.-K.; Choi, J; Cho, Y; Kim, B; Lee, Kwyro, 2012 EuroSOI, IES, the Southern Electronics Institute, 2012-01 |
MOSFET Device Originated Harmonic Distortion Analysis and Optimum Design Methodology for SOI SPDT RF Switch Im, D; Kim, B.-K.; Choi, J; Cho, Y; Kim, B; Lee, K, The 19th Korean Conference on Semiconductors (KCS2012), 2012-02-16 |
On a fuzzy detection scheme for weak stochastic signals Son, J.C.; Song, Iickho; Kim, Hyung-Myung; Choi, J; Kim, S; Kim, SY, International Symposium on Signals, Systems, and Electronics (ISSSE), pp.536 - 539, IEEE, 1992-09 |
Phase Transition of Yb-Doped Er-Silicide for NMOS Application Choi, J; Na, S; Lee, HJ; Lee, Seok-Hee; Kim, H, International Union of Materials Research Society-International Conference in Asia, International Union of Materials Research Society, 2012-08-28 |
Quantum engineering of a diamond spin-qubit with a nano-electro-mechanical system Sohn, Youngik; Meesala, S; Meesala, S; Atikian, HA; Holzgrafe, J; Gundogan, M; Stavrakas, C; et al, Gordon Research Conferences (Quantum Sensing), Gordon Research Conferences, 2017-07 |
Secret Key Agreement for Massive MIMO Systems with Two-Way Training Under Pilot Contamination Attack Im, S; Choi, J; Ha, Jeongseok, IEEE GLOBECOM 2015, IEEE, 2015-12 |
Several Statistical Properties of MUSIC Null-Spectrum Choi, J; Song, Iickho; Yun, JS; Kim, Hyung-Myung; Lee, KY, 5th Canadian Conference on Electrical and Computer Engineering, pp.1 - 4, IEEE, 1991-09 |
Solvent-free, Jet-on-demand Printing of Organic Materials: Digital-mode Organic Vapor-jet Printing Yoo, Seunghyup; Choi, J, International Conference on Advanced Electromaterials [ICAE 2013], The Korean Institute of Electrical and Electronic Material Engineers, 2013-11-13 |
TEM investigation of Ytterbium silicide formation process for Schottky contact applications Na, S; Choi, J; Choi, H; Seo, Y; Kim, H; Lee, Seok-Hee; Lee, HJ, International union of microbeam analysis societies and International Symposium on atomic level characterization for new materials and devices, Korean Society of Microscopy, 2011-05 |
Discover