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A 100mK-NETD 100ms-startup-time 80×60 micro-bolometer CMOS thermal imager integrated with a 0.234mm2 1.89μV<inf>rms</inf> noise 12b biasing DAC

Kim, Ki Duk; Park, Seunghyun; Yoon, Kye Seok; Kang, Gyeong Gu; Han, Hyun Ki; Choi, Ji Su; Ko, Min Woo; et al, 2018 IEEE International Solid-State Circuits Conference (ISSCC), pp.192, IEEE, 2018-02-13

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