Browse "EE-Conference Papers(학술회의논문)" by Author Lee, C.-H.

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10
The influence of gate poly-silicon oxidation on negative bias temperature instability in 3D FinFET

Lee, H.; Lee, C.-H.; Park, D.; Choi, Yang-Kyu, 45th Annual IEEE International Reliability Physics Symposium 2007, IRPS, pp.680 - 681, IEEE, 2007-04-15

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