Showing results 6 to 7 of 7
NLNL: Negative Learning for Noisy Labels Kim, Youngdong; Yim, Junho; Yun, Juseung; Kim, Junmo, 17th IEEE/CVF International Conference on Computer Vision, ICCV 2019, Institute of Electrical and Electronics Engineers Inc., 2019-10-29 |
Unconstrained Control of Feature Map Size Using Non-integer Strided Sampling Ju, Donggyu; Yim, Junho; Kim, Junmo, 29th British Machine Vision Conference (BMVC 2018), the British Machine Vision Association, 2018-09-04 |
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