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Micromachined picosecond optical near-field probe for purse-coupling measurement of interconnection lines

Kim, Joungho; Lee, Jongjoo; Lee, Heeseok; Baek, Seungyong; Jung, Yuchul, IEEE 9th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP2000, pp.185 - 188, IEEE, 2000-10

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