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Sub-5nm All-Around Gate FinFET for Ultimate Scaling Lee, Hyunjin; Yu, Lee-Eun; Ryu, Seong-Wan; Han, Jin-Woo; Jeon, Kanghoon; Jang, Dong-Yoon; Kim, Kuk-Hwan; et al, IEEE Symposium on VLSI Technology Digest of Technical Papaers, pp. 70-71, 2006-06-13 |
Sub-lithographic Vertical Nanogap Fabrication for Electrical Detection of Protein-Ligand Interactions Choi, Yang-Kyu; Jang, Dong-Yoon; Kim, Young-Pil; Kim, Hak-Sung, Electron, Ion, and Photon Beam Technology & Nanofabrication, pp.431 - 432, 2005-05-31 |
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