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Identifying redundant inter-cell margins and its application to reducing routing congestion CHUNG, WOOHYUN; Shim, Seongbo; Shin, Youngsoo, Design, Automation & Test in Europe (DATE), European Design and Automation Association (EDAA), 2015-03-12 |
Synthesis of lithographic test patterns through topology-oriented pattern extraction and classification Shim, Seongbo; CHUNG, WOOHYUN; Shin, Youngsoo, SPIE Advanced Lithography, pp.1 - 10, SPIE, 2014-02-25 |
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