Browse "EE-Conference Papers(학술회의논문)" by Author Xu, Z
Showing results 3 to 3 of 3
| Bipolar current stressing and electrical recovery of quasi-breakdown in thin gate oxides Cho, Byung Jin; Loh, WY; Li, MF; Xu, Z, 8th International Symp. on the Physical and Failure Analysis of Integrated Circuits (IPFA), pp.59 - 59, 2001-07-09 |
Discover
Type
- 107 Article
- 8 Book
- 22,776 Conference
Date issued
- 2,090 2020 - 2024
- 8,145 2010 - 2019
- 7,999 2000 - 2009
- 3,741 1990 - 1999
- 870 1980 - 1989