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Characteristics of ZnO thin film for the resistive random access memory Seo, J.W.; Baik, S.J.; Kang, S.J.; Lim, Koeng Su, 2010 MRS Spring Meeting, pp.239 - 243, 2010 MRS Spring Meeting, 2010-04-05 |
Charge diffusion in silicon nitrides: Scalability assessment of nitride based flash memory Baik, S.J.; Lim, Koeng Su; Choi, W.; Yoo, H.; Shin, H., 49th International Reliability Physics Symposium, IRPS 2011, IEEE, 2011-04-10 |
Negative differential resistance characteristics of silicon nanocrystal memory Baik, S.J.; Lim, Koeng Su, Amorphous and Heterogeneus Silicon Thin Films-2000, v.609, 2000-04-24 |
Tungsten oxide as a P-type window material in amorphous silicon solar cells Fang, L.; Baik, S.J.; Kim, J.W.; Yoo, S.H.; Jeon, J.-W.; Kang, S.J.; Kim, Y.H.; et al, 35th IEEE Photovoltaic Specialists Conference, PVSC 2010, pp.1496 - 1499, IEEE, 2010-06-20 |
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