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A Study of Dual-Bit Nonvolatile Memory Characteristics by the Channel-Hot-Electron (CHEI) Program Mechanism for Double-Gate FinFET SONOS Cells 최양규; 류성완; 한진우; 김진수; 이광희; 이기성; 오재섭; et al, 제 15회 반도체 학술대회, pp.409 - 410, 2008 |
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