TCE oxidation이 interface trap density 와 minority carrier generation lifetime 에 미치는 영향Effects of TCE oxidation on interface trap density and minority carrier generation lifetime
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.advisor | 김충기 | - |
| dc.contributor.advisor | Kim, Choong-Ki | - |
| dc.contributor.author | 소순태 | - |
| dc.contributor.author | Soh, Sun-Tae | - |
| dc.date.accessioned | 2011-12-14T02:20:16Z | - |
| dc.date.available | 2011-12-14T02:20:16Z | - |
| dc.date.issued | 1981 | - |
| dc.identifier.uri | http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=63033&flag=dissertation | - |
| dc.identifier.uri | http://hdl.handle.net/10203/39540 | - |
| dc.description | 학위논문(석사) - 한국과학기술원 : 전기 및 전자공학과, 1981.2, [ [ii], 115 p. ] | - |
| dc.language | kor | - |
| dc.publisher | 한국과학기술원 | - |
| dc.title | TCE oxidation이 interface trap density 와 minority carrier generation lifetime 에 미치는 영향 | - |
| dc.title.alternative | Effects of TCE oxidation on interface trap density and minority carrier generation lifetime | - |
| dc.type | Thesis(Master) | - |
| dc.identifier.CNRN | 63033/325007 | - |
| dc.description.department | 한국과학기술원 : 전기 및 전자공학과, | - |
| dc.identifier.uid | 000791120 | - |
| dc.contributor.localauthor | 김충기 | - |
| dc.contributor.localauthor | Kim, Choong-Ki | - |
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