(An) automatic transistor testing system using microcomputer system 85

Cited 0 time in webofscience Cited 0 time in scopus
  • Hit : 366
  • Download : 0
An automatic transistor testing system using microcomputer system 85 is designed and implemented to execute several parameters of transistor-current gain, breakdown voltage, and leakage current. This system consists of hardwired transistor testing system and MCS85, 8 bit word microcomputer with key board and teletypewriter. And the computer system will generate clocks of programmed length for system timing pulse. The hardwired transistor testing system consists of two programmable voltage sources and two programmable current sources, the switching parts and measurement circuitry. Hardwired system measures current gain, breakdown voltage, and leakage current. The computer system compares this data with given comparison limit and decided either Go or No Go. The system speed is 7,000 per hour including one handler. There is a growing tendency that the Automatic System instead of the conventional labor-forced system is developed for mass production and high quality.
Advisors
Park, Song-Bae박송배
Description
한국과학기술원 : 전기 및 전자공학과,
Publisher
한국과학기술원
Issue Date
1979
Identifier
62477/325007 / 000771161
Language
eng
Description

학위논문 (석사) - 한국과학기술원 : 전기 및 전자공학과, 1979.2, [ [iii], 86 p. ]

URI
http://hdl.handle.net/10203/39498
Link
http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=62477&flag=dissertation
Appears in Collection
EE-Theses_Master(석사논문)
Files in This Item
There are no files associated with this item.

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0