Scattering effect of light by rough surface of semiconductor반도체 표면 요철에 의한 빛의 산란 효과
Kirchhoff method is first applied to calculating the scattering effect of light in rough surface of semiconductor. The surface is assumed as Gaussian rough surface. Both backward scattering into the upper medium and forward transmitted scattering into the medium below the interface is illustrated. The dependence of the polarized scattering on surface parameters(rms height, correlation length) and incident and scattering directions is considered.
- Advisors
- Lim, Koeng-Suresearcher; 임굉수researcher
- Description
- 한국과학기술원 : 전기및전자공학전공,
- Publisher
- 한국과학기술원
- Issue Date
- 2002
- Identifier
- 174077/325007 / 020003030
- Language
- eng
- Description
학위논문(석사) - 한국과학기술원 : 전기및전자공학전공, 2002.2, [ iii, 57 p. ]
- Keywords
roughness; scattering; semiconductor; 반도체; 요철; 산란
- Appears in Collection
- EE-Theses_Master(석사논문)
- Files in This Item
- There are no files associated with this item.
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