Quasi-Static C-V 측정 방법을 이용한 interface trapped charge에 관한 연구Study on the interface trapped charge using quasi-static C-V method
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.advisor | 이희철 | - |
| dc.contributor.advisor | Lee, Hee-Chul | - |
| dc.contributor.author | 김상호 | - |
| dc.contributor.author | Kim, Sang-Ho | - |
| dc.date.accessioned | 2011-12-14T01:48:50Z | - |
| dc.date.available | 2011-12-14T01:48:50Z | - |
| dc.date.issued | 2001 | - |
| dc.identifier.uri | http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=169390&flag=dissertation | - |
| dc.identifier.uri | http://hdl.handle.net/10203/37482 | - |
| dc.description | 학위논문(석사) - 한국과학기술원 : 전기및전자공학전공, 2001.8, [ i, 32 p. ] | - |
| dc.language | kor | - |
| dc.publisher | 한국과학기술원 | - |
| dc.subject | 메모리 | - |
| dc.subject | 강유전체 | - |
| dc.subject | 알루미늄 산화막 | - |
| dc.subject | Pt-Al2O3-Pt | - |
| dc.subject | Quasi-Static | - |
| dc.subject | Memory | - |
| dc.subject | Ferroelectric | - |
| dc.subject | Aluminum oxide | - |
| dc.title | Quasi-Static C-V 측정 방법을 이용한 interface trapped charge에 관한 연구 | - |
| dc.title.alternative | Study on the interface trapped charge using quasi-static C-V method | - |
| dc.type | Thesis(Master) | - |
| dc.identifier.CNRN | 169390/325007 | - |
| dc.description.department | 한국과학기술원 : 전기및전자공학전공, | - |
| dc.identifier.uid | 000993095 | - |
| dc.contributor.localauthor | 이희철 | - |
| dc.contributor.localauthor | Lee, Hee-Chul | - |
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