Quasi-Static C-V 측정 방법을 이용한 interface trapped charge에 관한 연구Study on the interface trapped charge using quasi-static C-V method
- Advisors
- 이희철researcher; Lee, Hee-Chulresearcher
- Description
- 한국과학기술원 : 전기및전자공학전공,
- Publisher
- 한국과학기술원
- Issue Date
- 2001
- Identifier
- 169390/325007 / 000993095
- Language
- kor
- Description
학위논문(석사) - 한국과학기술원 : 전기및전자공학전공, 2001.8, [ i, 32 p. ]
- Keywords
메모리; 강유전체; 알루미늄 산화막; Pt-Al2O3-Pt; Quasi-Static; Memory; Ferroelectric; Aluminum oxide
- Appears in Collection
- EE-Theses_Master(석사논문)
- Files in This Item
- There are no files associated with this item.
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