학위논문(석사) - 한국과학기술원 : 전기및전자공학과, 1999.2, [ ii, 55 p. ]
스프라인함수; 공정독립; 등가회로 추출; 기생성분; 모델; Cold-FET; Spline function; Process independent; Parameter extraction; Nonquasi-static; FET model; Parasitic elements
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.