DSpace at KOASAS: La2O3 계면 처리를 통한 In2O3 박막 트랜지스터 전기적 특성 및 신뢰성 개선

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College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Conference Papers(학술회의논문)

La2O3 계면 처리를 통한 In2O3 박막 트랜지스터 전기적 특성 및 신뢰성 개선

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Park, Donguk / Park, YoungKeun / Jeong, Jaejoong / SHIN, GEONHEE / KIM, SHEUNGHUN / Cho, Byung-Jin researcher

Publisher: 한국전기전자재료학회

Issue Date: 2025-06-19

Language: Korean

Citation: 2025 한국전기전자재료학회 하계학술대회

URI: http://hdl.handle.net/10203/335804

Appears in Collection: EE-Conference Papers(학술회의논문)

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La2O3 계면 처리를 통한 In2O3 박막 트랜지스터 전기적 특성 및 신뢰성 개선

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