DC Field | Value | Language |
---|---|---|
dc.contributor.advisor | Kim, Se-Hun | - |
dc.contributor.advisor | 김세훈 | - |
dc.contributor.author | Chung, Young-Su | - |
dc.contributor.author | 정영수 | - |
dc.date.accessioned | 2011-12-13T05:01:01Z | - |
dc.date.available | 2011-12-13T05:01:01Z | - |
dc.date.issued | 1996 | - |
dc.identifier.uri | http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=105601&flag=dissertation | - |
dc.identifier.uri | http://hdl.handle.net/10203/32743 | - |
dc.description | 학위논문(석사) - 한국과학기술원 : 화학과, 1996.2, [ ii, 51 p. ] | - |
dc.description.abstract | The growth of thin $MgF_2$ films on Si(111) was studied with in situ LEED and ex situ XRD. When $MgF_2$ was deposited onto the Si(111)-surface and annealed from room temperature, a series of LEED patterns (1×1→3×1→Si(111)-7×7) was observed. The 3×1 phase was formed upon annealing the film at 700~800℃ and was stable over a wide temperature range. At such high temperature, $MgF_2$ is likely to dissociate, with evaporation of fluorines and formation of a 3×1 structure. If the annealing temprature was slowly raised, complex LEED patterns were observed between 1×1 and 3×1 phase. These patterns are attributed to the partially disordered surface layer in the course of forming the 3×1 structure. One of them is a third-order splitting pattern. To identify this structure, we calculated diffraction patterns within kinematic approximation for a number of antiphase models and could obtain a similar pattern. The corresponding structure has a dominant 3×1 surface structure but a true surface exists with a large unit cell because of the regular antiphase arrangement. From XRD studies we found out that the deposited $MgF_2$ film was oriented in (110) direction. | eng |
dc.language | eng | - |
dc.publisher | 한국과학기술원 | - |
dc.subject | MgF2 | - |
dc.subject | XRD | - |
dc.subject | LEED | - |
dc.subject | Si(111) | - |
dc.subject | 실리콘 (111) 표면 | - |
dc.subject | X선회절 | - |
dc.subject | 저에너지 전자 회절 | - |
dc.subject | 플루오르화마그네슘 박막 | - |
dc.title | LEED and XRD study of ultrathin MgF2 film on Si(111) surface | - |
dc.title.alternative | 실리콘 (111) 표면 위의 플루오르화마그네슘 박막의 저에너지 전자 회절과 X선 회절에 관한 연구 | - |
dc.type | Thesis(Master) | - |
dc.identifier.CNRN | 105601/325007 | - |
dc.description.department | 한국과학기술원 : 화학과, | - |
dc.identifier.uid | 000943505 | - |
dc.contributor.localauthor | Kim, Se-Hun | - |
dc.contributor.localauthor | 김세훈 | - |
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