An experimental and numerical study on adhesion force at the nanoscale

Cited 0 time in webofscience Cited 0 time in scopus
  • Hit : 2
  • Download : 0
DC FieldValueLanguage
dc.contributor.authorKim Su-Hyunko
dc.contributor.authorChoi Pan-Kyuko
dc.contributor.authorLee Yong-Bokko
dc.contributor.authorKim Tae-Sooko
dc.contributor.authorJo Min-Seungko
dc.contributor.authorLee So-Youngko
dc.contributor.authorMin Hyun-Wooko
dc.contributor.authorYoon Jun-Boko
dc.date.accessioned2024-07-24T08:00:05Z-
dc.date.available2024-07-24T08:00:05Z-
dc.date.created2024-07-24-
dc.date.issued2024-04-
dc.identifier.citationNANOSCALE ADVANCES, v.6, no.8-
dc.identifier.issn2516-0230-
dc.identifier.urihttp://hdl.handle.net/10203/320315-
dc.description.abstractAdhesion has attracted great interest in science and engineering especially in the field pertaining to nano-science because every form of physical contact is fundamentally a macroscopic observation of interactions between nano-asperities under the adhesion phenomenon. Despite its importance, no practical adhesion prediction model has been developed due to the complexity of examining contact between nano-asperities. Here, we scrutinized the contact phenomenon and developed a contact model, reflecting the physical sequence in which adhesion develops. For the first time ever, our model analyzes the adhesion force and contact properties, such as separation distance, contact location, actual contact area, and the physical deformation of the asperities, between rough surfaces. Through experiments using atomic force microscopy, we demonstrated a low absolute percentage error of 2.8% and 6.55% between the experimental and derived data for Si-Si and Mo-Mo contacts, respectively, and proved the accuracy and practicality of our model in the analysis of the adhesion phenomenon.,A practical prediction adhesion model utilizing iterative and realistic contact analysis with experimental verification.,-
dc.languageEnglish-
dc.publisherROYAL SOC CHEMISTRY-
dc.titleAn experimental and numerical study on adhesion force at the nanoscale-
dc.typeArticle-
dc.identifier.wosid001173650600001-
dc.type.rimsART-
dc.citation.volume6-
dc.citation.issue8-
dc.citation.publicationnameNANOSCALE ADVANCES-
dc.contributor.localauthorYoon Jun-Bo-
dc.contributor.nonIdAuthorKim Su-Hyun-
dc.contributor.nonIdAuthorChoi Pan-Kyu-
dc.contributor.nonIdAuthorLee Yong-Bok-
dc.contributor.nonIdAuthorKim Tae-Soo-
dc.contributor.nonIdAuthorJo Min-Seung-
dc.contributor.nonIdAuthorLee So-Young-
dc.contributor.nonIdAuthorMin Hyun-Woo-
Appears in Collection
EE-Journal Papers(저널논문)
Files in This Item
There are no files associated with this item.

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0