Method of inspecting printing quality of 3D printing object using femtosecond laser beam during 3D printing process, and apparatus and 3D printing system for the same3D 프린팅 공정 중 펨토초 레이저 빔을 이용하여 프린팅 대상물의 적층 품질을 검사하는 방법, 장치 및 이를 구비한 3D 프린팅 시스템

Cited 0 time in webofscience Cited 0 time in scopus
  • Hit : 54
  • Download : 0
DC FieldValueLanguage
dc.contributor.authorSohn, Hoonko
dc.contributor.authorLiu, Peipeiko
dc.date.accessioned2024-04-18T07:00:47Z-
dc.date.available2024-04-18T07:00:47Z-
dc.identifier.urihttp://hdl.handle.net/10203/319102-
dc.description.abstractDisclosed are a method of inspecting a printing quality of a 3D printing object using a femtosecond laser beam during a 3D printing process, and an apparatus and a 3D printing system for the same. A laser beam is irradiated from a femtosecond laser source disposed coaxially with a 3D printing laser source to inspect a state of the printing object. The laser beam generated by the femtosecond laser source is separated into a pump laser beam and a probe laser beam. The printing laser beam irradiated from a 3D printing laser source or the pump laser beam is irradiated onto a printing object to generate ultrasonic waves. To measure the ultrasonic waves, a probe laser beam is irradiated onto the printing object. The probe laser beam reflected by the printing object is detected. The quality of the printing object is inspected by analyzing the reflected probe laser beam.-
dc.titleMethod of inspecting printing quality of 3D printing object using femtosecond laser beam during 3D printing process, and apparatus and 3D printing system for the same-
dc.title.alternative3D 프린팅 공정 중 펨토초 레이저 빔을 이용하여 프린팅 대상물의 적층 품질을 검사하는 방법, 장치 및 이를 구비한 3D 프린팅 시스템-
dc.typePatent-
dc.type.rimsPAT-
dc.contributor.localauthorSohn, Hoon-
dc.contributor.assigneeKAIST-
dc.identifier.iprsType특허-
dc.identifier.patentApplicationNumber17128658-
dc.identifier.patentRegistrationNumber11858040-
dc.date.application2020-12-21-
dc.date.registration2024-01-02-
dc.publisher.countryUS-
Appears in Collection
CE-Patent(특허)
Files in This Item
There are no files associated with this item.

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0