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College of Engineering(공과대학)School of Electrical Engineering(전기및전자공학부)EE-Conference Papers(학술회의논문)

Role of Inter-Layer Dielectric on the Electrical and Heat Dissipation Characteristics in the Heterogeneous 3D Sequential CFETs with Ge pFETs on Si nFETs

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dc.contributor.authorKim, Seongkwangko
dc.contributor.authorLim, Hyeong-Rakko
dc.contributor.authorSHIM, JOONSUPko
dc.contributor.authorBaek, Woo Jinko
dc.contributor.authorKim, Seonghoko
dc.contributor.authorPark, YoungKeunko
dc.contributor.authorJeong, Jaejoongko
dc.contributor.authorLim, Jinhako
dc.contributor.authorKIM, JOON PYOko
dc.contributor.authorJeong, Jaeyongko
dc.contributor.authorKim, Bong Hoko
dc.contributor.authorGeum, Dae-Myongko
dc.contributor.authorCho, Byung-Jinko
dc.contributor.authorKim, Sanghyeonko
dc.date.accessioned2023-12-05T05:00:53Z-
dc.date.available2023-12-05T05:00:53Z-
dc.date.created2023-11-21-
dc.date.created2023-11-21-
dc.date.issued2023-12-11-
dc.identifier.citation2023 International Electron Devices Meeting (IEDM)-
dc.identifier.issn0163-1918-
dc.identifier.urihttp://hdl.handle.net/10203/315719-
dc.languageEnglish-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.titleRole of Inter-Layer Dielectric on the Electrical and Heat Dissipation Characteristics in the Heterogeneous 3D Sequential CFETs with Ge pFETs on Si nFETs-
dc.typeConference-
dc.type.rimsCONF-
dc.citation.publicationname2023 International Electron Devices Meeting (IEDM)-
dc.identifier.conferencecountryUS-
dc.identifier.conferencelocationSan Francisco, CA-
dc.contributor.localauthorCho, Byung-Jin-
dc.contributor.nonIdAuthorKim, Seongho-
dc.contributor.nonIdAuthorGeum, Dae-Myong-
dc.contributor.nonIdAuthorKim, Sanghyeon-
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EE-Conference Papers(학술회의논문)
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