DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Seongkwang | ko |
dc.contributor.author | Lim, Hyeong-Rak | ko |
dc.contributor.author | SHIM, JOONSUP | ko |
dc.contributor.author | Baek, Woo Jin | ko |
dc.contributor.author | Kim, Seongho | ko |
dc.contributor.author | Park, YoungKeun | ko |
dc.contributor.author | Jeong, Jaejoong | ko |
dc.contributor.author | Lim, Jinha | ko |
dc.contributor.author | KIM, JOON PYO | ko |
dc.contributor.author | Jeong, Jaeyong | ko |
dc.contributor.author | Kim, Bong Ho | ko |
dc.contributor.author | Geum, Dae-Myong | ko |
dc.contributor.author | Cho, Byung-Jin | ko |
dc.contributor.author | Kim, Sanghyeon | ko |
dc.date.accessioned | 2023-12-05T05:00:53Z | - |
dc.date.available | 2023-12-05T05:00:53Z | - |
dc.date.created | 2023-11-21 | - |
dc.date.created | 2023-11-21 | - |
dc.date.issued | 2023-12-11 | - |
dc.identifier.citation | 2023 International Electron Devices Meeting (IEDM) | - |
dc.identifier.issn | 0163-1918 | - |
dc.identifier.uri | http://hdl.handle.net/10203/315719 | - |
dc.language | English | - |
dc.publisher | Institute of Electrical and Electronics Engineers Inc. | - |
dc.title | Role of Inter-Layer Dielectric on the Electrical and Heat Dissipation Characteristics in the Heterogeneous 3D Sequential CFETs with Ge pFETs on Si nFETs | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | 2023 International Electron Devices Meeting (IEDM) | - |
dc.identifier.conferencecountry | US | - |
dc.identifier.conferencelocation | San Francisco, CA | - |
dc.contributor.localauthor | Cho, Byung-Jin | - |
dc.contributor.nonIdAuthor | Kim, Seongho | - |
dc.contributor.nonIdAuthor | Geum, Dae-Myong | - |
dc.contributor.nonIdAuthor | Kim, Sanghyeon | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.