DC Field | Value | Language |
---|---|---|
dc.contributor.author | Song, Yong | ko |
dc.contributor.author | Hwang, Woomin | ko |
dc.contributor.author | Park, Ki-Woong | ko |
dc.contributor.author | Park, Kyu Ho | ko |
dc.date.accessioned | 2023-11-15T05:00:20Z | - |
dc.date.available | 2023-11-15T05:00:20Z | - |
dc.date.created | 2023-11-15 | - |
dc.date.issued | 2013-09 | - |
dc.identifier.citation | 4th International Conference on Mobile, Ubiquitous, and Intelligent Computing, MUSIC 2013, pp.315 - 320 | - |
dc.identifier.uri | http://hdl.handle.net/10203/314691 | - |
dc.description.abstract | By microscopically observing widely used data files, we identified the considerable room for life time improvement in NAND flash memory, which is due to the discovery of a non-uniformity in bit-level data patterns. In an attempt to exploit the discovery, we propose a novel bit-level wear-leveling scheme. Instead of considering only the view of page-level or block-level, we incorporate the non-uniformity in data encoding patterns into wear-leveling scheme. Because of its orthogonality to the existing block-level wear-leveling approaches, our solution can be adopted over the existing solutions without considerable overhead and extend NAND flash's life span up to 36% in case of SLC. | - |
dc.language | English | - |
dc.publisher | Springer Verlag | - |
dc.title | Microscopic bit-level wear-leveling for NAND flash memory | - |
dc.type | Conference | - |
dc.identifier.scopusid | 2-s2.0-84958523465 | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 315 | - |
dc.citation.endingpage | 320 | - |
dc.citation.publicationname | 4th International Conference on Mobile, Ubiquitous, and Intelligent Computing, MUSIC 2013 | - |
dc.identifier.conferencecountry | KO | - |
dc.identifier.conferencelocation | Gwangju | - |
dc.identifier.doi | 10.1007/978-3-642-40675-1_48 | - |
dc.contributor.localauthor | Park, Kyu Ho | - |
dc.contributor.nonIdAuthor | Park, Ki-Woong | - |
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