Electro-optic and converse piezoelectric coefficients of epitaxial thin films: GaN grown on Si, and (Sr,Ba)Nb2O6 (SBN) grown on Pt coated MgO
We report the first measurement of the (r13, r33) Pockels electro-optic coefficients in a SBN thin film and in a GaN thin film grown on silicon. The converse-piezoelectric and electro-absorptive coefficients are simultaneously determined.
- Publisher
- Optical Society of America (OSA)
- Issue Date
- 2014-06
- Language
- English
- Citation
CLEO: Applications and Technology, CLEO_AT 2014
- ISSN
- 2160-9020
- Appears in Collection
- PH-Conference Papers(학술회의논문)
- Files in This Item
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