DC Field | Value | Language |
---|---|---|
dc.contributor.author | Martins Ferreira, Erlon H | ko |
dc.contributor.author | Ren, Lingling | ko |
dc.contributor.author | Piao, Guangzhe | ko |
dc.contributor.author | Hong, Soon Hyung | ko |
dc.contributor.author | Tachibana, Masaru | ko |
dc.contributor.author | Sergo, Valter | ko |
dc.contributor.author | Bonifacio, Alois | ko |
dc.contributor.author | Martinez, Froylan | ko |
dc.contributor.author | Kato, Ryoei | ko |
dc.contributor.author | Miyazawa, Kun'Ichi | ko |
dc.date.accessioned | 2023-10-11T12:00:49Z | - |
dc.date.available | 2023-10-11T12:00:49Z | - |
dc.date.created | 2023-10-11 | - |
dc.date.issued | 2015-09 | - |
dc.identifier.citation | 17th International Congress of Metrology, CIM 2015 | - |
dc.identifier.uri | http://hdl.handle.net/10203/313223 | - |
dc.language | English | - |
dc.publisher | EDP Sciences | - |
dc.title | Towards the standardization of fullerene nanofibers using Raman spectroscopy | - |
dc.type | Conference | - |
dc.identifier.scopusid | 2-s2.0-84980347907 | - |
dc.type.rims | CONF | - |
dc.citation.publicationname | 17th International Congress of Metrology, CIM 2015 | - |
dc.identifier.conferencecountry | FR | - |
dc.identifier.conferencelocation | Paris | - |
dc.identifier.doi | 10.1051/metrology/20150014004 | - |
dc.contributor.localauthor | Hong, Soon Hyung | - |
dc.contributor.nonIdAuthor | Martins Ferreira, Erlon H | - |
dc.contributor.nonIdAuthor | Ren, Lingling | - |
dc.contributor.nonIdAuthor | Piao, Guangzhe | - |
dc.contributor.nonIdAuthor | Tachibana, Masaru | - |
dc.contributor.nonIdAuthor | Sergo, Valter | - |
dc.contributor.nonIdAuthor | Bonifacio, Alois | - |
dc.contributor.nonIdAuthor | Martinez, Froylan | - |
dc.contributor.nonIdAuthor | Kato, Ryoei | - |
dc.contributor.nonIdAuthor | Miyazawa, Kun'Ichi | - |
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