Optimization of the effect of radiation on ASIC chip through detector

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dc.contributor.authorChang, Hojongko
dc.contributor.authorHan, Byunghunko
dc.contributor.authorCho, Gyuseongko
dc.contributor.authorKim, Yonghoko
dc.contributor.authorJeon, Woosookko
dc.contributor.authorKim, Hyundukko
dc.date.accessioned2023-08-15T03:01:46Z-
dc.date.available2023-08-15T03:01:46Z-
dc.date.created2023-07-07-
dc.date.created2023-07-07-
dc.date.issued2018-10-
dc.identifier.citation9th International Conference on Information and Communication Technology Convergence, ICTC 2018, pp.1485 - 1487-
dc.identifier.urihttp://hdl.handle.net/10203/311525-
dc.description.abstractThe photon counting detecting system is a direct image detection method that counts one by one when incident photons are larger than noise. So it is differs from conventional radiation image detecting equipment. This system has an advantage of measuring low dose and low energy and also possible to make a colorful image. In this study we were targeting CdZnTe semiconductor as detector. Optimize CdZnTe's thickness to consider the influence of the X-ray passing through CdZnTe on the ROIC circuit using Geant4 simulation.-
dc.languageEnglish-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.titleOptimization of the effect of radiation on ASIC chip through detector-
dc.typeConference-
dc.identifier.wosid000517984800346-
dc.identifier.scopusid2-s2.0-85059470780-
dc.type.rimsCONF-
dc.citation.beginningpage1485-
dc.citation.endingpage1487-
dc.citation.publicationname9th International Conference on Information and Communication Technology Convergence, ICTC 2018-
dc.identifier.conferencecountryKO-
dc.identifier.conferencelocationJeju Island-
dc.identifier.doi10.1109/ICTC.2018.8539458-
dc.contributor.localauthorChang, Hojong-
dc.contributor.localauthorCho, Gyuseong-
dc.contributor.nonIdAuthorHan, Byunghun-
dc.contributor.nonIdAuthorKim, Yongho-
dc.contributor.nonIdAuthorJeon, Woosook-
dc.contributor.nonIdAuthorKim, Hyunduk-
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